PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS

被引：39

作者：

CEREZO, A

GROVENOR, CRM

SMITH, GDW

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1986年 / 141卷

关键词：

D O I：

10.1111/j.1365-2818.1986.tb02712.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：155 / 170

页数：16

共 32 条

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[7] RESONANT HEATING IN PHOTODESORPTION VIA LASER-ADSORBATE COUPLING
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[J]. PHYSICAL REVIEW B, 1983, 28 (04): : 2119 - 2124
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[9] Grovenor C. R. M., 1985, Layered Structures, Epitaxy, and Interfaces Symposium, P199
[10] GROVENOR CRM, 1982, SURF SCI, V123, pL686, DOI 10.1016/0039-6028(82)90115-7