Thermoelectric property characterization of low-dimensional structures

被引：15

作者：

Chen, G ^{[1
]}

Yang, B ^{[1
]}

Liu, WL ^{[1
]}

Borca-Tasciuc, T ^{[1
]}

Song, D ^{[1
]}

Achimov, D ^{[1
]}

Dresselhaus, MS ^{[1
]}

Liu, JL ^{[1
]}

Wang, K ^{[1
]}

机构：

[1] Univ Calif Los Angeles, Dept Mech & Aerosp Engn, Los Angeles, CA 90095 USA

来源：

TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/ICT.2001.979616

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction. i.e., either parallel or perpendicular to the thin-film plane.

引用

页码：30 / 34

页数：5

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