A Lithographic Process for Integrated Organic Field-Effect Transistors
被引:22
作者:
Kymissis, Ioannis
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USAMIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USA
Kymissis, Ioannis
[1
]
Akinwande, Akintunde Ibitayo
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USA
MIT, Microsyst Technol Lab, Cambridge, MA 02139 USAMIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USA
Akinwande, Akintunde Ibitayo
[1
,2
]
Bulovic, Vladimir
论文数: 0引用数: 0
h-index: 0
机构:
MIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USAMIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USA
Bulovic, Vladimir
[1
]
机构:
[1] MIT, Lab Organ Opt & Elect, Cambridge, MA 02139 USA
[2] MIT, Microsyst Technol Lab, Cambridge, MA 02139 USA
来源:
JOURNAL OF DISPLAY TECHNOLOGY
|
2005年
/
1卷
/
02期
关键词:
Organic compounds;
thin-film transistors;
D O I:
10.1109/JDT.2005.858915
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper reports a photolithographic process for fabricating organic field-effect transistors which provides two layers of metal with arbitrary via placement, and optionally allows for subtractive lithographic patterning of the transistor active layer. The demonstrated pentacene transistors have a field-effect mobility of 0.1 +/- 0.05 cm(2)/(Vs). Parylene-C is used both as the gate dielectric and an encapsulation layer which allows for subtractive lithographic patterning. Also demonstrated is a PMOS inverter without level shifting circuitry and level-restoring V-High and V-Low. This work demonstrates a high definition, multilayer, integrated photolithographic process which creates organic field effect transistors suitable for use in integrated circuit applications such as a display backplanes.
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Dimitrakopoulos, CD
;
Furman, BK
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Furman, BK
;
Graham, T
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Graham, T
;
Hegde, S
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Hegde, S
;
Purushothaman, S
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
机构:
Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USAPenn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Gundlach, DJ
;
Jackson, TN
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Jackson, TN
;
Schlom, DG
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Schlom, DG
;
Nelson, SF
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Dimitrakopoulos, CD
;
Furman, BK
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Furman, BK
;
Graham, T
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Graham, T
;
Hegde, S
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
Hegde, S
;
Purushothaman, S
论文数: 0引用数: 0
h-index: 0
机构:
IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USAIBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
机构:
Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USAPenn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Gundlach, DJ
;
Jackson, TN
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Jackson, TN
;
Schlom, DG
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA
Schlom, DG
;
Nelson, SF
论文数: 0引用数: 0
h-index: 0
机构:Penn State Univ, Dept Elect Engn, Ctr Thin Film Devices, University Pk, PA 16802 USA