Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing

被引：36

作者：

Marcano, AO ^{[1
]}

Maillotte, H ^{[1
]}

Gindre, D ^{[1
]}

Metin, D ^{[1
]}

机构：

[1] UNIV FRANCHE COMTE,LAB OPT PM DUFFIEUX,URA CTR NATL RECH SCI 214,F-25030 BESANCON,FRANCE

来源：

OPTICS LETTERS | 1996年 / 21卷 / 02期

关键词：

D O I：

10.1364/OL.21.000101

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-field pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan. (C) 1996 Optical Society of America

引用

页码：101 / 103

页数：3

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