Triggered lightning testing of an airport runway lighting system

被引:28
作者
Bejleri, M [1 ]
Rakov, VA
Uman, MA
Rambo, KJ
Mata, CT
Fernandez, MI
机构
[1] Motorola Inc, iDEN Subscriber Div, Plantation, FL 33322 USA
[2] Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA
[3] ASRC Aerosp, Kennedy Space Ctr, FL 32899 USA
[4] US Dept Defense, Ft George G Meade, MD 20755 USA
基金
美国国家科学基金会;
关键词
airport runway; counterpoise; ground rods; lighting system; lightning protection; triggered lightning;
D O I
10.1109/TEMC.2004.823617
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The interaction of rocket-triggered lightning with an airport runway lighting system has been studied. The lighting system included a buried counterpoise with attached vertical ground rods for protection of the series lighting cable from lightning. Experimental data for voltages and currents at various locations in the runway lighting system due to direct lightning strikes are presented along with the causative lightning current. The data include the first measurements of the responses of an underground bare conductor.(counterpoise) to direct lightning strikes. These measurements can serve as ground truth for the testing of the validity of various counterpoise models.
引用
收藏
页码:96 / 101
页数:6
相关论文
共 4 条
[1]  
BEJLERI M, 1999, THESIS U FLORIDA GAI
[2]   New insights into lightning processes gained from triggered-lightning experiments in Florida and Alabama [J].
Rakov, VA ;
Uman, MA ;
Rambo, KJ ;
Fernandez, MI ;
Fisher, RJ ;
Schnetzer, GH ;
Thottappillil, R ;
Eybert-Berard, A ;
Berlandis, JP ;
Lalande, P ;
Bonamy, A ;
Laroche, P ;
Bondiou-Clergerie, A .
JOURNAL OF GEOPHYSICAL RESEARCH-ATMOSPHERES, 1998, 103 (D12) :14117-14130
[3]   Direct lightning strikes to the lightning protective system of a residential building: Triggered-lightning experiments [J].
Rakov, VA ;
Uman, MA ;
Fernandez, MI ;
Mata, CT ;
Rambo, KJ ;
Stapleton, MV ;
Sutil, RR .
IEEE TRANSACTIONS ON POWER DELIVERY, 2002, 17 (02) :575-586
[4]  
Uman M. A., 1997, Transactions of the Institute of Electrical Engineers of Japan, Part B, V117-B, P446