Differential anomalous X-ray scattering studies of amorphous Cd59As41 and Cd26As74

The local structure of amorphous cadmium arsenide semiconducting films has been studied by differential anomalous X-ray scattering. Intensity measurements were carried out on two samples, containing 41 and 74 at.% As, in the vicinity of the absorption K edges of both constituents using synchrotron radiation. The computational procedure, similar to that proposed by Warren for an amorphous sample with more than one kind of atom, was applied to obtain the structural parameters from the experimental data. It has been found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and that the investigated films are chemically ordered. The structural changes going from cadmium- to arsenic-rich composition have been revealed. The differential anomalous X-ray scattering technique proved to be effective, providing the evidence for the Cd-Cd and As-As near neighbour correlations in Cd59As41 and Cd26As74, respectively. The simulations of the differential radial distribution functions have shown that for the amorphous film containing 41 at.% As the distorted tetrahedral structure, intermediate between the CdAs and Si III type structures, is adequate to account for the experimental data. At 74 at.% As, the atomic arrangement can be described satisfactorily by the structural model based on the tetragonal CdAs, structure. The structural parameters obtained from the present study and those previously derived using the extended X-ray absorption fine structure and conventional large angle X-ray scattering techniques are compared.