Probe Tips Functionalized with Colloidal Nanocrystal Tetrapods for High-Resolution Atomic Force Microscopy Imaging

被引：20

作者：

Nobile, Concetta ^{[1
]}

Ashby, Paul D. ^{[2
]}

Schuck, P. James ^{[2
]}

Fiore, Angela ^{[1
]}

Mastria, Rosanna ^{[1
]}

Cingolani, Roberto ^{[1
]}

Manna, Liberato ^{[1
]}

Krahne, Roman ^{[1
]}

机构：

[1] CNR, INFM, Natl Nanotechnol Lab, Distretto Technol ISUFI, I-73100 Lecce, Italy

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Imaging Facil Mol Foundry, Berkeley, CA 94720 USA

来源：

SMALL | 2008年 / 4卷 / 12期

关键词：

atomic force microscopy; functionalized tips; nanocrystals; tetrapods;

D O I：

10.1002/smll.200800604

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The positioning of single CdTe tetrapods on flattened atomic force microscopy (AFM) tips and the feasibility of these tips through the vertical tetrapod arm for high resolution, was investigated. The flat areas on the extremity of the AFM tips were obtained by scanning commercially available AFM tips for approximately 1 hour in contact mode on a diamond coated substrate. Then a thin metal layer of Cr/Au or Pd was evaporated on the tip side of the cantilever. The CdTe tetrapods dissolved in toluene were deposited on the flat tip edge from solution using a procedure similar to electrostatic trapping. A maximum slope of 80% from the steep left and right sections of the vertical arm was obtained. The AFM study on similar CdTe tetrapods reported a considerable percentage of tetrapods with shortened vertical arms, and suggested that the damage was due to capillary forces during the drying process of the solvent.

引用

页码：2123 / 2126

页数：4

共 23 条

[1] Electrostatic trapping of single conducting nanoparticles between nanoelectrodes [J].

Bezryadin, A ;

Dekker, C ;

Schmid, G .

APPLIED PHYSICS LETTERS, 1997, 71 (09) :1273-1275

[2] Multiple wurtzite twinning in CdTe nanocrystals induced by methylphosphonic acid [J].

Carbone, L ;

Kudera, S ;

Carlino, E ;

Parak, WJ ;

Giannini, C ;

Cingolani, R ;

Manna, L .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2006, 128 (03) :748-755

[3] Fabrication of high-aspect-ratio carbon nanocone probes by electron beam induced deposition patterning [J].

Chen, I-Chen ;

Chen, Li-Han ;

Orme, Christine ;

Quist, Arjan ;

Lal, Ratnesh ;

Jin, Sungho .

NANOTECHNOLOGY, 2006, 17 (17) :4322-4326

[4] Extremely sharp carbon nanocone probes for atomic force microscopy imaging [J].

Chen, IC ;

Chen, LH ;

Ye, XR ;

Daraio, C ;

Jin, S ;

Orme, CA ;

Quist, A ;

Lal, R .

APPLIED PHYSICS LETTERS, 2006, 88 (15)

[5] Single-walled carbon nanotube AFM probes: Optimal imaging resolution of nanoclusters and biomolecules in ambient and fluid environments [J].

Chen, LW ;

Cheung, CL ;

Ashby, PD ;

Lieber, CM .

NANO LETTERS, 2004, 4 (09) :1725-1731

[6] Growth and fabrication with single-walled carbon nanotube probe microscopy tips [J].

Cheung, CL ;

Hafner, JH ;

Odom, TW ;

Kim, K ;

Lieber, CM .

APPLIED PHYSICS LETTERS, 2000, 76 (21) :3136-3138

[7] Measurement of the conductance of single conjugated molecules [J].

Dadosh, T ;

Gordin, Y ;

Krahne, R ;

Khivrich, I ;

Mahalu, D ;

Frydman, V ;

Sperling, J ;

Yacoby, A ;

Bar-Joseph, I .

NATURE, 2005, 436 (7051) :677-680

[8] Nanotubes as nanoprobes in scanning probe microscopy [J].

Dai, HJ ;

Hafner, JH ;

Rinzler, AG ;

Colbert, DT ;

Smalley, RE .

NATURE, 1996, 384 (6605) :147-150

[9] Quantum-dot-functionalized scanning probes for fluorescence-energy-transfer-based microscopy [J].

Ebenstein, Y ;

Mokari, T ;

Banin, U .

JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (01) :93-99

[10] Interaction of scanning probes with semiconductor nanocrystals; physical mechanism and basis for near-field optical imaging [J].

Ebenstein, Yuval ;

Yoskovitz, Eyal ;

Costi, Ronny ;

Aharoni, Assaf ;

Banin, Uri .

JOURNAL OF PHYSICAL CHEMISTRY A, 2006, 110 (27) :8297-8303

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