Development of buffer layers for high quality Tl-Pb-Sr-Ba-Ca-Cu-O thick films on flexible metal substrates

被引：4

作者：

Parilla, PA ^{[1
]}

McGraw, JM ^{[1
]}

Schulz, DL ^{[1
]}

Wendelin, J ^{[1
]}

Bhattacharya, RN ^{[1
]}

Blaugher, RD ^{[1
]}

Ginley, DS ^{[1
]}

Voigt, JA ^{[1
]}

Roth, EP ^{[1
]}

机构：

[1] SANDIA NATL LABS,ALBUQUERQUE,NM 87185

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期

关键词：

D O I：

10.1109/77.620973

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Previous work has demonstrated the ability to grow extremely high quality Tl0.5Pb0.5Sr1.6Ba0.4Ca2Cu3Ox epitaxial films up to 15 mu m thick using melt growth techniques on single crystal LaAlO3 substrates, This melt growth process is an ideal candidate for producing high quality superconducting films on flexible metal substrates with textured buffer layers; however, the textured buffer layer of choice, cubic yttria-stabilized zirconia (YSZ), appears to be incompatible with the melt growth of Tl-Pb-Sr-Ba-Ca-Cu-O films, In this work, we investigate textured buffer layers which are compatible with the epitaxial growth of Tl0.5Pb0.5Sr1.6Ba0.4Ca2Cu3Ox films. Crucial properties for the successful development of a suitable buffer layer are lattice matching, chemical stability, and texture, Buffer layer materials investigated are CeO2 and LaAlO3 grown using a UV (248 nm) pulsed excimer laser deposition system equipped with multiple targets and a controlled ambient, Influence of substrate temperature and ambient gas pressure and flow on buffer growth are analyzed via XRD characterization. Highly textured buffer layers have been fabricated.

引用

页码：1969 / 1972

页数：4

共 8 条

[1]

AHN JH, 1982, CHEM ENHANCED ORIENT

[2] INPLANE ALIGNED YBA2CU3O7-X THIN-FILMS DEPOSITED ON POLYCRYSTALLINE METALLIC SUBSTRATES [J].