Structure determination of the indium-induced Si(111)-(4 x 1) reconstruction by surface x-ray diffraction

被引:171
作者
Bunk, O
Falkenberg, G
Zeysing, JH
Lottermoser, L
Johnson, RL
Nielsen, M
Berg-Rasmussen, F
Baker, J
Feidenhans'l, R
机构
[1] Univ Hamburg, Inst Expt Phys 2, D-22761 Hamburg, Germany
[2] Riso Natl Lab, Condensed Matter Phys & Chem Dept, DK-4000 Roskilde, Denmark
来源
PHYSICAL REVIEW B | 1999年 / 59卷 / 19期
关键词
D O I
10.1103/PhysRevB.59.12228
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A detailed structural model for the indium-induced Si(111)-(4 x 1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic (h omega=9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data. [S0163-1829(99)08419-2].
引用
收藏
页码:12228 / 12231
页数:4
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