X-ray photoelectron spectroscopy of Er3+-activated SiO2-HfO2 glass-ceramic waveguides

被引:21
作者
Minati, L. [1 ]
Speranza, G. [1 ]
Micheli, V. [1 ]
Ferrari, M. [2 ]
Jestin, Y. [2 ]
机构
[1] FBK, I-38100 Trento, Italy
[2] CNR, IFN, Ist Foton & Nanotecnol, CSMFO Lab, I-38100 Trento, Italy
关键词
SILICATE THIN-FILMS; PHASE-SEPARATION;
D O I
10.1088/0022-3727/42/1/015408
中图分类号
O59 [应用物理学];
学科分类号
摘要
xHfO(2)-(100 - x) SiO2 (x = 10, 20, 30 mol%) glass-ceramic planar waveguides doped with 0.3 mol% Er3+ ions, prepared by the sol-gel route and heat treated at 1000 degrees C to nucleate HfO2 crystals, were analysed by x-ray photoelectron spectroscopy, x-ray diffraction, high resolution transmission electron microscopy and photoluminescence spectroscopy. Formation of tetragonal HfO2 nanocrystals has been evidenced in all the samples. Spectroscopic parameters concerning the I-4(13/2) metastable state of Er3+ ion are revisited as a function of XPS analysis.
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页数:5
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