Engineering of Si surfaces by electrochemical grafting of p-nitrobenzene molecules

被引:44
作者
Hartig, P
Rappich, J
Dittrich, T
机构
[1] Hahn Meitner Inst Berlin GmbH, Abt Si Photovoltaik, D-12489 Berlin, Germany
[2] Tech Univ Munich, Phys Dept E16, D-85748 Garching, Germany
关键词
D O I
10.1063/1.1430265
中图分类号
O59 [应用物理学];
学科分类号
摘要
The changes of the band bending and of the nonradiative (nr) surface recombination are investigated by use of photovoltage and photoluminescence techniques during the electrochemical deposition of p-nitrobenzene molecules on atomically flat and rough hydrogenated as well as on chemically oxidized Si(111) surfaces. A simple and well-reproducible procedure has been developed for electrochemical grafting of organic molecules on hydrogenated Si surfaces in aqueous electrolytes. The grafting of a monolayer of p-nitrobenzene molecules on atomically flat p-Si(111):H surfaces induces a change of the band bending of about 0.1 eV and the amount of nr surface defects, N-s, is only slightly increased by a factor of about 3 (N-s< 10(11) cm(-2)) with respect to the hydrogenated Si surface. The role of the formation of radicals for the engineering of Si surfaces is discussed. (C) 2002 American Institute of Physics.
引用
收藏
页码:67 / 69
页数:3
相关论文
共 11 条
  • [1] Organic monolayers on Si(111) by electrochemical method
    Allongue, P
    de Villeneuve, CH
    Pinson, J
    Ozanam, F
    Chazalviel, JN
    Wallart, X
    [J]. ELECTROCHIMICA ACTA, 1998, 43 (19-20) : 2791 - 2798
  • [2] Structural characterization of organic monolayers on Si⟨111⟩ from capacitance measurements
    Allongue, P
    de Villeneuve, CH
    Pinson, J
    [J]. ELECTROCHIMICA ACTA, 2000, 45 (20) : 3241 - 3248
  • [3] Demonstration of an imide coupling reaction on a Si(100)-2x1 surface by molecular layer deposition
    Bitzer, T
    Richardson, NV
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (05) : 662 - 664
  • [4] The electronic properties at the maleic anhydride/Si(100)-2 x 1 interface
    Bitzer, T
    Dittrich, T
    Rada, T
    Richardson, NV
    [J]. CHEMICAL PHYSICS LETTERS, 2000, 331 (5-6) : 433 - 438
  • [5] INFRARED-SPECTROSCOPY OF SI(111) AND SI(100) SURFACES AFTER HF TREATMENT - HYDROGEN TERMINATION AND SURFACE-MORPHOLOGY
    CHABAL, YJ
    HIGASHI, GS
    RAGHAVACHARI, K
    BURROWS, VA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 2104 - 2109
  • [6] Passivation of an anodic oxide/p-Si interface stimulated by electron injection
    Dittrich, T
    Burke, T
    Koch, F
    Rappich, J
    [J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (08) : 4636 - 4642
  • [7] COMPARISON OF SI(111) SURFACES PREPARED USING AQUEOUS-SOLUTIONS OF NH4F VERSUS HF
    HIGASHI, GS
    BECKER, RS
    CHABAL, YJ
    BECKER, AJ
    [J]. APPLIED PHYSICS LETTERS, 1991, 58 (15) : 1656 - 1658
  • [8] RAPPICH J, 2002, THIN FILMS HDB, V4, pCH1
  • [9] STRADINS JP, 1973, ENCY ELEMENTS, V12, P78
  • [10] Quantitative analysis of room temperature photoluminescence of c-Si wafers excited by short laser pulses
    Timoshenko, VY
    Petrenko, AB
    Stolyarov, MN
    Dittrich, T
    Fuessel, W
    Rappich, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 4171 - 4175