Interface Trap States in Organic Photodiodes

被引:65
作者
Arca, Francesco [1 ,2 ]
Tedde, Sandro F. [1 ]
Sramek, Maria [1 ]
Rauh, Julia [3 ]
Lugli, Paolo [2 ]
Hayden, Oliver [1 ]
机构
[1] Siemens AG, Corp Technol, D-91058 Erlangen, Germany
[2] Tech Univ Munich, Inst Nanoelect, D-80333 Munich, Germany
[3] Univ Wurzburg, Fac Phys & Astron, D-97074 Wurzburg, Germany
来源
SCIENTIFIC REPORTS | 2013年 / 3卷
关键词
POLYMER;
D O I
10.1038/srep01324
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Organic semiconductors are attractive for optical sensing applications due to the effortless processing on large active area of several cm(2), which is difficult to achieve with solid-state devices. However, compared to silicon photodiodes, sensitivity and dynamic behavior remain a major challenge with organic sensors. Here, we show that charge trapping phenomena deteriorate the bandwidth of organic photodiodes (OPDs) to a few Hz at low-light levels. We demonstrate that, despite the large OPD capacitances of similar to 10 nF cm(-2), a frequency response in the kHz regime can be achieved at light levels as low as 20 nW cm(-2) by appropriate interface engineering, which corresponds to a 1000-fold increase compared to state-of-the-art OPDs. Such device characteristics indicate that large active area OPDs are suitable for industrial sensing and even match medical requirements for single X-ray pulse detection in the millisecond range.
引用
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页数:5
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