Optical measurement of size and complex index of laser-damage precursors: the inverse problem

被引：34

作者：

Gallais, L ^{[1
]}

Voarino, P ^{[1
]}

Amra, C ^{[1
]}

机构：

[1] Ecole Natl Super Phys Marseille, Inst Fresnel, CNRS, UMR, F-13397 Marseille 20, France

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2004年 / 21卷 / 05期

关键词：

D O I：

10.1364/JOSAB.21.001073

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An indirect optical method for determining size and complex refractive index of laser-damage precursors in optical materials is presented. The method is described in detail, with special attention to all assumptions. Results are given for a series of thin-film SiO2 layers. (C) 2004 Optical Society of America.

引用

页码：1073 / 1080

页数：8

共 52 条

[1]

ALLEN SD, 1982, APPL PHYS LETT, V41, P215

[2] HfO2 films with high laser damage threshold [J].

Alvisi, M ;

Di Giulio, M ;

Marrone, SG ;

Perrone, MR ;

Protopapa, ML ;

Valentini, A ;

Vasanelli, L .

THIN SOLID FILMS, 2000, 358 (1-2) :250-258

[3] Statistical distribution of laser damage and spatial scaling law for a model with multiple defects cooperation in damage [J].

Bercegol, H .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1999, 2000, 3902 :339-348

[4] ROLE OF CRACKS, PORES, AND ABSORBING INCLUSIONS ON LASER-INDUCED DAMAGE THRESHOLD AT SURFACES OF TRANSPARENT DIELECTRICS [J].

BLOEMBERGEN, N .

APPLIED OPTICS, 1973, 12 (04) :661-664

[5] Study of UV laser interaction with gold nanoparticles embedded in silica [J].

Bonneau, F ;

Combis, P ;

Rullier, JL ;

Vierne, J ;

Pellin, M ;

Savina, M ;

Broyer, M ;

Cottancin, E ;

Tuaillon, J ;

Pellarin, M ;

Gallais, L ;

Natoli, JV ;

Perra, M ;

Bercegol, H ;

Lamaignère, L ;

Loiseau, M ;

Donohue, JT .

APPLIED PHYSICS B-LASERS AND OPTICS, 2002, 75 (08) :803-815

[6] Simulations of laser damage of SiO2 induced by a spherical inclusion [J].

Bonneau, F ;

Combis, P ;

Vierne, J ;

Daval, G .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2000, PROCEEDINGS, 2001, 4347 :308-315

[7] Characterization of optical coatings by photothermal deflection [J].

Commandre, M ;

Roche, P .

APPLIED OPTICS, 1996, 35 (25) :5021-5034

[8] Angle-resolved ellipsometry of light scattering:: discrimination of surface and bulk effects in substrates and optical coatings [J].

Deumié, C ;

Giovannini, H ;

Amra, C .

APPLIED OPTICS, 2002, 41 (16) :3362-3369

[9] Nano absorbing centers: A key point in laser damage of thin films. [J].

Dijon, J ;

Poiroux, T ;

Desrumaux, C .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1996, 1997, 2966 :315-325

[10] One Hundred Joule per square centimeter 1.06μm mirrors. [J].

Dijon, J ;

Rafin, B ;

Pellé, C ;

Hue, J ;

Ravel, G ;

André, B .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1999, 2000, 3902 :158-168

← 1 2 3 4 5 6 →