Influence of in-plane crystalline quality of an antiferromagnet on perpendicular exchange coupling and exchange bias -: art. no. 134436

被引：60

作者：

Fitzsimmons, MR

Leighton, C

Nogués, J

Hoffmann, A

Liu, K

Majkrzak, CF

Dura, JA

Groves, JR

Springer, RW

Arendt, PN

Leiner, V

Lauter, H

Schuller, IK

机构：

[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[2] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA

[3] Univ Autonoma Barcelona, Inst Catalana Recerca & Estudis Avancats, Bellaterra, Spain

[4] Univ Autonoma Barcelona, Dept Fis, Bellaterra, Spain

[5] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

[6] Inst Max Von Laue Paul Langevin, F-38042 Grenoble, France

来源：

PHYSICAL REVIEW B | 2002年 / 65卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.65.134436

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have undertaken a systematic study of the influence of in-plane crystalline quality of the antiferromagnet on exchange bias. Polarized neutron reflectometry and magnetometry were used to determine the anisotropies of polycrystalline ferromagnetic (F) Fe thin films exchange coupled to antiferromagnetic (AF) untwinned single crystal (110) FeF2, twinned single crystal (110) FeF2 thin films and (110) textured polycrystalline FeF2 thin films. A correlation between the anisotropies of the AF and F thin films with exchange bias was identified. Specifically, when exchange coupling across the F-AF interface introduces an additional anisotropy axis in the F thin film-one perpendicular to the cooling field, the magnetization reversal mechanism is affected (as observed with neutron scattering) and exchange bias is significantly enhanced.

引用

页码：1 / 8

页数：8

共 36 条

[1] Dependence of exchange coupling on antiferromagnetic layer thickness in NiFe/CoO bilayers [J].