Dependence of exchange coupling on antiferromagnetic layer thickness in NiFe/CoO bilayers

被引：123

作者：

Ambrose, T ^{[1
]}

Chien, CL ^{[1
]}

机构：

[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1998年 / 83卷 / 11期

关键词：

D O I：

10.1063/1.367863

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A systematic study of the dependence of exchange coupling in NiFe/CoO bilayers on CoO layer thickness t(AF) from 5 to 500 Angstrom has been made. For large CoO thicknesses (t(AF)>00 Angstrom), the exchange field varies as 1/t(AF), whereas for small CoO thicknesses (t(AF)<100 Angstrom), finite-size scaling of the Neel temperature T-N and also the blocking temperature T-B dominate. (C) 1998 American Institute of Physics.

引用

页码：6822 / 6824

页数：3

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