Surface morphology and kinetic roughening of Ag on Ag(111) studied with scanning tunneling microscopy

被引：14

作者：

Heyvaert, I ^{[1
]}

Krim, J ^{[1
]}

VanHaesendonck, C ^{[1
]}

Bruynseraede, Y ^{[1
]}

机构：

[1] KATHOLIEKE UNIV LEUVEN,VASTE STOF FYS & MAGNETISME LAB,B-3001 HEVERLEE,BELGIUM

来源：

PHYSICAL REVIEW E | 1996年 / 54卷 / 01期

关键词：

D O I：

10.1103/PhysRevE.54.349

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The topography of Ag grown on Ag(111) measured with scanning tunneling microscopy reveals three-dimensional, layered islands for film thicknesses below 500 Angstrom. For thicker Ag films, the layered structures can no longer be observed. The induced surface roughness increases with increasing film thickness and corresponds to the formation of self-similar surfaces with roughness exponents H close to 1 for thicknesses up to 5000 Angstrom. Our results are compared to the relevant theoretical models.

引用

页码：349 / 353

页数：5

共 26 条

[1] SURFACE-STRUCTURE OF THIN METALLIC-FILMS ON MICA AS SEEN BY SCANNING TUNNELING MICROSCOPY, SCANNING ELECTRON-MICROSCOPY, AND LOW-ENERGY ELECTRON-DIFFRACTION [J].

BUCHHOLZ, S ;

FUCHS, H ;

RABE, JP .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :857-861

[2] THE SURFACE STATISTICS OF A GRANULAR AGGREGATE [J].

EDWARDS, SF ;

WILKINSON, DR .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 381 (1780) :17-31

[3] OBSERVATION OF A GROWTH INSTABILITY DURING LOW-TEMPERATURE MOLECULAR-BEAM EPITAXY [J].

ERNST, HJ ;

FABRE, F ;

FOLKERTS, R ;

LAPUJOULADE, J .

PHYSICAL REVIEW LETTERS, 1994, 72 (01) :112-115

[4] SCALING OF THE ACTIVE ZONE IN THE EDEN PROCESS ON PERCOLATION NETWORKS AND THE BALLISTIC DEPOSITION MODEL [J].

FAMILY, F ;

VICSEK, T .

JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1985, 18 (02) :L75-L81

[5] DYNAMIC SCALING AND PHASE-TRANSITIONS IN INTERFACE GROWTH [J].

FAMILY, F .

PHYSICA A, 1990, 168 (01) :561-580

[6] ROUGHENING AND FACETING IN A PB THIN-FILM GROWING ON THE PB(110) SURFACE [J].

FANG, K ;

LU, TM ;

WANG, GC .

PHYSICAL REVIEW B, 1994, 49 (12) :8331-8339

[7] Comparative study of the interface roughness of Ag/Au and Cu/Au multilayers with scanning tunneling microscopy and x-ray diffraction [J].

Heyvaert, I ;

Temst, K ;

VanHaesendonck, C ;

Bruynseraede, Y .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1121-1125

[8] STABLE GROWTH AND KINETIC ROUGHENING IN ELECTROCHEMICAL DEPOSITION [J].

IWAMOTO, A ;

YOSHINOBU, T ;

IWASAKI, H .

PHYSICAL REVIEW LETTERS, 1994, 72 (25) :4025-4028

[9] STABLE AND UNSTABLE GROWTH IN MOLECULAR-BEAM EPITAXY [J].

JOHNSON, MD ;

ORME, C ;

HUNT, AW ;

GRAFF, D ;

SUDIJONO, J ;

SANDER, LM ;

ORR, BG .

PHYSICAL REVIEW LETTERS, 1994, 72 (01) :116-119

[10] SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES [J].

KRIM, J ;

HEYVAERT, I ;

VANHAESENDONCK, C ;

BRUYNSERAEDE, Y .

PHYSICAL REVIEW LETTERS, 1993, 70 (01) :57-60

← 1 2 3 →