STABLE GROWTH AND KINETIC ROUGHENING IN ELECTROCHEMICAL DEPOSITION

被引:80
作者
IWAMOTO, A
YOSHINOBU, T
IWASAKI, H
机构
[1] Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567
关键词
D O I
10.1103/PhysRevLett.72.4025
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We studied kinetic roughening of copper which was electrodeposited at slow rates. The surfaces showed a unique scaling. In the shorter length regime, the interface width scaled with the length scale L as L(alpha) (alpha = 0.87 +/- 0.05). In the longer length regime, the width scaled with the deposition time t as t(beta) (beta = 0.45 +/- 0.05). The value of alpha + alpha/beta, 2.8, is much larger than 2 predicted for the case where the growing direction is normal to the surface everywhere. The scaling behavior is interpreted as the result of enhanced growth of the protrusions owing to nonlocal Laplacian growth effect.
引用
收藏
页码:4025 / 4028
页数:4
相关论文
共 18 条
  • [1] ROUGHNESS DEVELOPMENT IN METAL ELECTRODEPOSITION .1. EXPERIMENTAL RESULTS
    BARKEY, DP
    MULLER, RH
    TOBIAS, CW
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (08) : 2199 - 2207
  • [2] BRADY RM, 1984, NATURE, V309, P225, DOI 10.1038/309225a0
  • [3] EDEN M, 1961, 4TH P BERK S MATH ST, V4
  • [4] Family F., 1991, DYNAMICS FRACTALS SU
  • [5] LAPLACE-FIELD-CONTROLLED AND DIFFUSION-FIELD-CONTROLLED GROWTH IN ELECTROCHEMICAL DEPOSITION
    GARIK, P
    BARKEY, D
    BENJACOB, E
    BOCHNER, E
    BROXHOLM, N
    MILLER, B
    ORR, B
    ZAMIR, R
    [J]. PHYSICAL REVIEW LETTERS, 1989, 62 (23) : 2703 - 2706
  • [6] MEASUREMENTS OF DYNAMIC SCALING FROM EPITAXIAL-GROWTH FRONT - FE FILM ON FE(001)
    HE, YL
    YANG, HN
    LU, TM
    WANG, GC
    [J]. PHYSICAL REVIEW LETTERS, 1992, 69 (26) : 3770 - 3773
  • [7] SELF-AFFINE GROWTH OF COPPER ELECTRODEPOSITS
    IWASAKI, H
    YOSHINOBU, T
    [J]. PHYSICAL REVIEW B, 1993, 48 (11): : 8282 - 8285
  • [8] COLUMNAR GROWTH AND KINETIC ROUGHENING IN ELECTROCHEMICAL DEPOSITION
    KAHANDA, GLMKS
    ZOU, XQ
    FARRELL, R
    WONG, PZ
    [J]. PHYSICAL REVIEW LETTERS, 1992, 68 (25) : 3741 - 3744
  • [9] DYNAMIC SCALING OF GROWING INTERFACES
    KARDAR, M
    PARISI, G
    ZHANG, YC
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 889 - 892
  • [10] SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES
    KRIM, J
    HEYVAERT, I
    VANHAESENDONCK, C
    BRUYNSERAEDE, Y
    [J]. PHYSICAL REVIEW LETTERS, 1993, 70 (01) : 57 - 60