Opportunities in High-Speed Atomic Force Microscopy

被引：47

作者：

Brown, Benjamin P. ^{[3
]}

Picco, Loren ^{[1
]}

Miles, Mervyn J. ^{[1
,4
]}

Faul, Charl F. J. ^{[2
,4
]}

机构：

[1] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England

[2] Univ Bristol, Sch Chem, Bristol BS8 1TS, Avon, England

[3] Univ Bristol, Ctr NSQI, Bristol Ctr Funct Nanomat, Bristol BS8 1FD, Avon, England

[4] Univ Bristol, Bristol Ctr Nanosci & Quantum Informat, Bristol BS8 1FD, Avon, England

来源：

SMALL | 2013年 / 9卷 / 19期

关键词：

atomic force microscopy; high-speed AFM; surface analysis; AFM lithography; scanning probe microscopy; INTEGRATED ACTUATOR; NANO-VISUALIZATION; CANTILEVERS; AFM; REVEALS; SCANNER; DESIGN; COMPENSATION; SURFACE; TIP;

D O I：

10.1002/smll.201203223

中图分类号：

O6 [化学];

学科分类号：

070301 [无机化学];

摘要：

The atomic force microscope (AFM) has become integrated into standard characterisation procedures in many different areas of research. Nonetheless, typical imaging rates of commercial microscopes are still very slow, much to the frustration of the user. Developments in instrumentation for high-speed AFM (HSAFM) have been ongoing since the 1990s, and now nanometer resolution imaging at video rate is readily achievable. Despite thorough investigation of samples of a biological nature, use of HSAFM instruments to image samples of interest to materials scientists, or to carry out AFM lithography, has been minimal. This review gives a summary of different approaches to and advances in the development of high-speed AFMs, highlights important discoveries made with new instruments, and briefly discusses new possibilities for HSAFM in materials science.

引用

页码：3201 / 3211

页数：11

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