High resolution in-situ imaging of reactive heterogeneous surfaces

被引：10

作者：

Garfias-Mesias, LF ^{[1
]}

Smyrl, WH ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Corros Res Ctr, Minneapolis, MN 55455 USA

来源：

ELECTROCHIMICA ACTA | 1999年 / 44卷 / 21-22期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/S0013-4686(99)00068-7

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method, PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries; Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：3651 / 3657

页数：7

共 22 条

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