Band-edge alignment of SiGe/Si quantum wells and SiGe/Si self-assembled islands

被引:76
作者
El Kurdi, M [1 ]
Sauvage, S [1 ]
Fishman, G [1 ]
Boucaud, P [1 ]
机构
[1] Univ Paris 11, CNRS, UMR 8622, Inst Elect Fondamentale, F-91405 Orsay, France
来源
PHYSICAL REVIEW B | 2006年 / 73卷 / 19期
关键词
D O I
10.1103/PhysRevB.73.195327
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the energy band gap and band lineup of SiGe/Si heterostructures either in the case of coherently strained quantum wells or in the case of SiGe/Si self-assembled islands. We take into account the strain field and the quantum confinement effects through an accurate description of the conduction band including the Delta and L bands. The strain field is calculated using a microscopic valence force field theory. The conduction-band diagram and energies are obtained from a 30-band k center dot p Hamiltonian accounting for the strain through the Bir-Pikus Hamiltonian. The band-edge description is first given for biaxially strained pseudomorphic SiGe layers. In SiGe quantum wells grown on relaxed silicon, the band line-up switches from type I to type II depending on the value of the average valence band offset. Applying the 30-band formalism to the case of heterostructures grown on relaxed silicon germanium buffer layers indicates that a better agreement with experimental data is obtained for a valence-band offset value Delta E-v=0.54x where x is the Ge composition. For this parameter, a type-II band lineup is thus expected for all compositions of pseudomorphic SiGe/relaxed Si heterostructures. For GeSi/Si islands, we take into account the strain relaxation in the surrounding Si matrix. A type-II band lineup is predicted for all Ge compositions. The near-infrared interband recombination energy of the islands is calculated as a function of their SiGe composition.
引用
收藏
页数:9
相关论文
共 33 条
[1]   TYPE-II BAND ALIGNMENT IN SI/SI1-XGEX QUANTUM-WELLS FROM PHOTOLUMINESCENCE LINE SHIFTS DUE TO OPTICALLY INDUCED BAND-BENDING EFFECTS - EXPERIMENT AND THEORY [J].
BAIER, T ;
MANTZ, U ;
THONKE, K ;
SAUER, R ;
SCHAFFLER, F ;
HERZOG, HJ .
PHYSICAL REVIEW B, 1994, 50 (20) :15191-15196
[2]  
BIR GL, 1990, SYMMETRY STRAIN INDU
[3]   DEFORMATION POTENTIALS OF K = 0 STATES OF TETRAHEDRAL SEMICONDUCTORS [J].
BLACHA, A ;
PRESTING, H ;
CARDONA, M .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1984, 126 (01) :11-36
[4]   VALENCE BAND STRUCTURE OF GERMANIUM-SILICON ALLOYS [J].
BRAUNSTEIN, R .
PHYSICAL REVIEW, 1963, 130 (03) :869-&
[5]   ENERGY-BAND STRUCTURE OF GERMANIUM AND SILICON - K.P METHOD [J].
CARDONA, M ;
POLLAK, FH .
PHYSICAL REVIEW, 1966, 142 (02) :530-&
[6]   VALENCE-BAND OFFSETS AT STRAINED SI/GE INTERFACES [J].
COLOMBO, L ;
RESTA, R ;
BARONI, S .
PHYSICAL REVIEW B, 1991, 44 (11) :5572-5579
[7]   LATTICE PARAMETER + DENSITY IN GERMANIUM-SILICON ALLOYS [J].
DISMUKES, JP ;
PAFF, RJ ;
EKSTROM, L .
JOURNAL OF PHYSICAL CHEMISTRY, 1964, 68 (10) :3021-&
[8]   Comparison between 6-band and 14-band k•p formalisms in SiGe/Si heterostructures -: art. no. 165333 [J].
El kurdi, M ;
Fishman, G ;
Sauvage, S ;
Boucaud, P .
PHYSICAL REVIEW B, 2003, 68 (16)
[9]   Band structure, deformation potentals, and carrier mobility in strained Si, Ge, and SiGe alloys [J].
Fischetti, MV ;
Laux, SE .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (04) :2234-2252
[10]   HOLE ENERGY-LEVELS AND INTERSUBBAND ABSORPTION IN MODULATION-DOPED SI/SI1-XGEX MULTIPLE-QUANTUM WELLS [J].
FROMHERZ, T ;
KOPPENSTEINER, E ;
HELM, M ;
BAUER, G ;
NUTZEL, JF ;
ABSTREITER, G .
PHYSICAL REVIEW B, 1994, 50 (20) :15073-15085