The relation between the defect structure, the surface roughness and the growth conditions of YBa2Cu3O7-delta films

被引：12

作者：

Dam, B ^{[1
]}

Traeholt, C ^{[1
]}

StaublePumpin, B ^{[1
]}

Rector, J ^{[1
]}

deGroot, DG ^{[1
]}

机构：

[1] DELFT UNIV TECHNOL, NATL CTR HREM, DELFT, NETHERLANDS

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 1997年 / 251卷 / 1-2期

关键词：

defect structure; surface roughness; growth conditions; YBa2Cu3O7-delta films;

D O I：

10.1016/S0925-8388(96)02764-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

YBa2Cu3O7-delta films on SrTiO3 are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APE-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.

引用

页码：27 / 30

页数：4

共 9 条

[1] EFFECT OF SMALL CHANGES IN COMPOSITION ON THE ELECTRICAL AND STRUCTURAL-PROPERTIES OF YBA2CU3O7 THIN-FILMS [J].