High-resolution measurement by a high-Tc superconductor sampler

被引:18
作者
Hidaka, M [1 ]
Satoh, T [1 ]
Koike, M [1 ]
Tahara, S [1 ]
机构
[1] NEC Corp Ltd, Fundamental Res Labs, Tsukuba, Ibaraki 3058501, Japan
关键词
D O I
10.1109/77.783923
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We measured a signal current waveform by using a high-T-c superconductor (HTS) sampler with a l-ps delay between every sampling point. The maximum time differential obtained in the measured waveform was 12 mu A/ps with a 2.5-mu A current sensitivity at 25 K. This result guarantees that the sampler is able to measure current waveforms correctly when their maximum time differential is less than 12 mu A/ps. The superior temporal response was achieved by using high-speed single-fluxquantum pulses generated in the HTS circuit. A unique feature of the sampler is that it directly measures the current with picosecond and microampere resolutions, Measurement of current flowing through wiring in a semiconductor large-scale integrated circuits is a promising application for the HTS sampler.
引用
收藏
页码:4081 / 4086
页数:6
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