Comment on "Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy" -: art. no. 039703

被引：8

作者：

Zdrojek, M

Mélin, T

Diesinger, H

Stiévenard, D

Gebicki, W

Adamowicz, L

机构：

[1] CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, Dept ISEN, F-59652 Villeneuve Dascq, France

[2] Warsaw Univ Technol, Fac Phys, PL-00662 Warsaw, Poland

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.96.039703

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页数：1

共 3 条

[1] Charging of single Si nanocrystals by atomic force microscopy [J].

Boer, EA ;

Bell, LD ;

Brongersma, ML ;

Atwater, HA ;

Ostraat, ML ;

Flagan, RC .

APPLIED PHYSICS LETTERS, 2001, 78 (20) :3133-3135

[2] Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy [J].

Paillet, M ;

Poncharal, P ;

Zahab, A .

PHYSICAL REVIEW LETTERS, 2005, 94 (18)

[3] Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy -: art. no. 213114 [J].

Zdrojek, M ;

Mélin, T ;

Boyaval, C ;

Stiévenard, D ;

Jouault, B ;

Wozniak, M ;

Huczko, A ;

Gebicki, W ;

Adamowicz, L .

APPLIED PHYSICS LETTERS, 2005, 86 (21) :1-3

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