Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy

被引：38

作者：

Paillet, M ^{[1
]}

Poncharal, P ^{[1
]}

Zahab, A ^{[1
]}

机构：

[1] Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 18期

关键词：

D O I：

10.1103/PhysRevLett.94.186801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report an experimental study of static charge distribution in individual single-walled carbon nanotubes grown on a Si+115 nm SiO2 substrate. From these experiments, we conclude that charges are distributed uniformly along the nanotubes. We demonstrate that electrostatic force microscopy can accurately measure the amount of charges per unit length. We found that this amount is diameter dependent and in the range of 1 electron per nanometer for a 2.5 nm nanotube at a potential of -3.5 V.

引用

页数：4

共 14 条

[1] Atomic force microscope tip-induced local oxidation of silicon: Kinetics, mechanism, and nanofabrication [J].

Avouris, P ;

Hertel, T ;

Martel, R .

APPLIED PHYSICS LETTERS, 1997, 71 (02) :285-287

[2] Scanned conductance microscopy of carbon nanotubes and λ-DNA [J].

Bockrath, M ;

Markovic, N ;

Shepard, A ;

Tinkham, M ;

Gurevich, L ;

Kouwenhoven, LP ;

Wu, MSW ;

Sohn, LL .

NANO LETTERS, 2002, 2 (03) :187-190

[3] Controlling energy-level alignments at carbon nanotube/Au contacts [J].

Cui, XD ;

Freitag, M ;

Martel, R ;

Brus, L ;

Avouris, P .

NANO LETTERS, 2003, 3 (06) :783-787

[4] Detection of electrostatic forces with an atomic force microscope: Analytical and experimental dynamic force curves in the nonlinear regime [J].

Dianoux, R ;

Martins, F ;

Marchi, F ;

Alandi, C ;

Comin, F ;

Chevrier, J .

PHYSICAL REVIEW B, 2003, 68 (04)

[5] NEW ONE-DIMENSIONAL CONDUCTORS - GRAPHITIC MICROTUBULES [J].

HAMADA, N ;

SAWADA, S ;

OSHIYAMA, A .

PHYSICAL REVIEW LETTERS, 1992, 68 (10) :1579-1581

[6] Charge density on a thin straight wire: The first visit [J].

Jackson, JD .

AMERICAN JOURNAL OF PHYSICS, 2002, 70 (04) :409-410

[7] Charge distribution and stability of charged carbon nanotubes [J].

Keblinski, P ;

Nayak, SK ;

Zapol, P ;

Ajayan, PM .

PHYSICAL REVIEW LETTERS, 2002, 89 (25)

[8] Relationship between charge distribution and its image by electrostatic force microscopy [J].

Lambert, J ;

Guthmann, C ;

Saint-Jean, M .

JOURNAL OF APPLIED PHYSICS, 2003, 93 (09) :5369-5376

[9] Permanent polarization and charge injection in thin anodic alumina layers studied by electrostatic force microscopy [J].

Lambert, J ;

Guthmann, C ;

Ortega, C ;

Saint-Jean, M .

JOURNAL OF APPLIED PHYSICS, 2002, 91 (11) :9161-9169

[10] Growth of silicon oxide on hydrogenated silicon during lithography with an atomic force microscope [J].

Marchi, F ;

Bouchiat, V ;

Dallaporta, H ;

Safarov, V ;

Tonneau, D ;

Doppelt, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (06) :2952-2956

← 1 2 →