Scanned conductance microscopy of carbon nanotubes and λ-DNA

被引:132
作者
Bockrath, M
Markovic, N
Shepard, A
Tinkham, M
Gurevich, L
Kouwenhoven, LP
Wu, MSW
Sohn, LL
机构
[1] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
[2] Delft Univ Technol, Dept Appl Phys, NL-2600 GA Delft, Netherlands
[3] Delft Univ Technol, DIMES, NL-2600 GA Delft, Netherlands
[4] Princeton Univ, Dept Phys, Princeton, NJ 08544 USA
关键词
D O I
10.1021/nl0100724
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have devised a scanned probe technique based on electrostatic force microscopy capable of probing the conductance of samples without requiring attached leads. We demonstrate that, using our technique, conductance can be probed on length scales as small as 0.4 mum. To demonstrate the utility of our technique, we use it to probe the conductance of DNA, a subject that has been the focus of intense debate with reported results ranging from metallic to insulating. In contrast to conducting single-wall carbon nanotubes, used as a control, individual strands of lambda-DNA, a widely studied sequence, are found to be insulating on the length scale probed.
引用
收藏
页码:187 / 190
页数:4
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