Relationship between charge distribution and its image by electrostatic force microscopy

被引：29

作者：

Lambert, J ^{[1
]}

Guthmann, C ^{[1
]}

Saint-Jean, M ^{[1
]}

机构：

[1] Univ Paris 07, Phys Solides Grp, F-75251 Paris 05, France

来源：

JOURNAL OF APPLIED PHYSICS | 2003年 / 93卷 / 09期

关键词：

D O I：

10.1063/1.1559411

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We shall demonstrate in this article that characterization of the charge distribution by electrostatic force microscopy is not straightforward: we will stress the important role played by the electrostatic images of the scanned charge distribution in the tip and by the operating mode in the formation of extra features in images obtained with this instrument. To illustrate this, we will describe two models that correspond to the scanning of small and extended charge distributions. These models will be compared with experimental images. (C) 2003 American Institute of Physics.

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页码：5369 / 5376

页数：8

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