Role of image forces in non-contact scanning force microscope images of ionic surfaces

被引：46

作者：

Kantorovich, LN ^{[1
]}

Foster, AS ^{[1
]}

Shluger, AL ^{[1
]}

Stoneham, AM ^{[1
]}

机构：

[1] UCL, Dept Phys & Astron, London WC1E 6BT, England

来源：

SURFACE SCIENCE | 2000年 / 445卷 / 2-3期

基金：

英国工程与自然科学研究理事会;

关键词：

AFM; construction and use of effective interatomic interactions; insulating films; metal-insulator interfaces; NaCl; surface defects;

D O I：

10.1016/S0039-6028(99)01086-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We consider the effect of the image interaction on the force acting between tip and surface in non-contact scanning force microscope experiments. This interaction is relevant when a conducting tip interacts with either a polar bulk sample or with a thick film grown on a conducting substrate. We compare the atomistic contribution due to the interaction between the microscopic tip apex and the sample with the macroscopic van der Weals and image contributions to the force on the tip for several representative NaCl clusters adsorbed on a metal substrate. We show that the microscopic force dominates above the plain (001) terrace sites and is solely responsible for image contrast. However, the image force becomes comparable to the microscopic force above the surface di-vacancy and dominates the interaction above a charged step. (C) 2000 Published by Elsevier Science B.V. All rights reserved.

引用

页码：283 / 299

页数：17

共 36 条

[1]

[Anonymous], 1993, ELECTRODYNAMICS CONT

[2] Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy [J].