Dynamic SFM with true atomic resolution on alkali halide surfaces

被引：75

作者：

Bammerlin, M

Luthi, R

Meyer, E

Baratoff, A

Lu, J

Guggisberg, M

Loppacher, C

Gerber, C

Guntherodt, HJ

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

[2] IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期

关键词：

D O I：

10.1007/s003390051148

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Large-amplitude dynamic force microscopy is used to study alkali halide surfaces. The {001} cleavage faces of NaF, RbBr, LiF, KI and NaCl could be atomically resolved with excellent stability. In all cases the observed lattice periods correspond to the bulk lattice of equally charged ions. The resonance frequency shift and the atomic corrugation amplitude tend to increase after successive tip crashes. This behaviour is explained by analogy with scanning tunnelling microscopy. In addition, the mean atomic corrugation is found to be comparable to the difference between the anion and cation ionic radii.

引用

页码：S293 / S294

页数：2

共 16 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].