SCANNING FORCE MICROSCOPY ON THE SI(111)7 X 7 SURFACE RECONSTRUCTION

被引：22

作者：

HOWALD, L ^{[1
]}

LUTHI, R ^{[1
]}

MEYER, E ^{[1
]}

GUTHNER, P ^{[1
]}

GUNTHERODT, HJ ^{[1
]}

机构：

[1] OMICRON VAKUUMPHYS GMBH, D-65232 TAUNUSSTEIN, GERMANY

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1994年 / 93卷 / 03期

关键词：

D O I：

10.1007/BF01312696

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Scanning force microscopy images of the Si(111)7 x 7 surface reconstruction are presented which are taken in the contact mode in ultrahigh vacuum. Topographic and lateral force data are acquired simultaneously. A special treatment of the sensing tip with PTFE helps to overcome the strong adhesion and wear effects that normally occur on this particular surface.

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收藏

页码：267 / 268

页数：2

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