Near-field imaging of the interference pattern of counterpropagating evanescent waves

被引:10
作者
Bozhevolnyi, SI
Bozhevolnaya, EA
机构
[1] Tech Univ Denmark, Mikroelekt Ctr, DK-2800 Lyngby, Denmark
[2] LK AS, DK-2750 Ballerup, Denmark
关键词
D O I
10.1364/OL.24.000747
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
It is generally accepted that measurement of the contrast of the intensity interference pattern formed by two counterpropagating evanescent waves can be used to characterize the resolving power of a collection near-field microscope. We argue that, if the light collected by a fiber probe propagates toward a detector in the form of guided fiber modes, then this perception is wrong. Using symmetry arguments and simple calculations, we show that, if an extended fiber probe is axially symmetric and oriented perpendicular to the propagation direction, then the measured contrast should always be equal to the contrast of the interference pattern. (C) 1999 Optical Society of America.
引用
收藏
页码:747 / 749
页数:3
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