In-situ observation of the microstructural evolution in germanium under the low-energy helium ion irradiation

被引:14
作者
Arakawa, K
Tsukamoto, T
Tadakuma, K
Yasuda, K
Ono, K
机构
[1] Shimane Univ, Interdisciplinary Fac Sci & Engn, Dept Mat Sci, Matsue, Shimane 6908504, Japan
[2] Origin Elect Co Ltd, Toshima Ku, Tokyo 171, Japan
来源
JOURNAL OF ELECTRON MICROSCOPY | 1999年 / 48卷 / 04期
关键词
lattice defect; radiation effect; germanium; helium; ion irradiation; electron microscopy;
D O I
10.1093/oxfordjournals.jmicro.a023695
中图分类号
TH742 [显微镜];
学科分类号
摘要
Effects of helium aroma on the defect clustering in germanium are examined by irradiation with low-energy helium ions, using a specially designed transmission electron microscope which is connected with an ion accelerator. Dynamic microstructure evolution under low-energy (10 keV) helium ion irradiation with a beam flux of 7.0x10(16) ions m(-2) s(-1) is observed at various temperatures between 85 and 870 It. Under around 290 K, a number of small defects (<6 nm in the diameter) are formed, which are probably of vacancy-helium complex and the precursor of {001} lenticular helium bubbles. At about 290-670 It, interstitial-type defects lying on {113} planes are mainly produced which grow to form perfect dislocation loops under the irradiation. The features of the {113} defects introduced under the low-energy helium ion irradiation are compared with those formed by electron irradiation. The enhanced formation of {113} interstitial-type defects and the extensive width of the defects under the irradiation of helium ions above 290 K imply the mechanism of helium cutting saturated bonds between germanium atoms.
引用
收藏
页码:399 / 405
页数:7
相关论文
共 24 条
[21]   ELECTRON-DIFFRACTION CHANNELING EFFECT ON DEFECT FORMATION IN SI WITH [110] ZONE-AXIS INCIDENCE [J].
TAKEDA, S ;
HORIUCHI, S .
ULTRAMICROSCOPY, 1994, 56 (1-3) :144-162
[22]  
Takeda S, 1997, INST PHYS CONF SER, P25
[23]   AGGLOMERATION OF SELF-INTERSTITIALS IN SI OBSERVED AT 450-DEGREES-C BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J].
TAKEDA, S ;
KAMINO, T .
PHYSICAL REVIEW B, 1995, 51 (04) :2148-2152
[24]  
TAKEDA S, 1992, MATER SCI FORUM, V83, P309, DOI 10.4028/www.scientific.net/MSF.83-87.309