Nano-undulations of nickel thin films on a substrate under compressive stress

被引：2

作者：

Coupeau, C ^{[1
]}

Colin, J ^{[1
]}

Grilhé, J ^{[1
]}

机构：

[1] Univ Poitiers, UFR Sci, Met Phys Lab, F-86960 Futuroscope, France

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1999年 / 79卷 / 08期

关键词：

D O I：

10.1080/095008399176850

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nickel thin films on a substrate have been studied in situ by atomic force microscopy during deformation. Undulations have been observed on the debonding regions, of very low amplitude and of periodicity of the order of 1 mu m Attempts are made to compare these experimental results with previous models of buckling instabilities of thin plates.

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页码：497 / 501

页数：5

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