Substrate-adlayer interaction at the C-60/Ag(110) interface studied by high-resolution synchrotron radiation

被引：24

作者：

Magnano, E

Vandre, S

Cepek, C

Goldoni, A

Laine, AD

Curro, GM

Santaniello, A

Sancrotti, M

机构：

[1] UNIV TRIESTE,DIPARTIMENTO FIS,I-34100 TRIESTE,ITALY

[2] CSRAFA,I-98166 SANT AGATA,MESSINA,ITALY

[3] UNIV MESSINA,DIPARTIMENTO FIS MAT & TECNOL FIS AVANZATE,I-98166 SANT AGATA,MESSINA,ITALY

[4] SINCROTRONE TRIESTE,I-34012 TRIESTE,ITALY

来源：

SURFACE SCIENCE | 1997年 / 377卷 / 1-3期

关键词：

fullerenes; metal-semiconductor interfaces; physical adsorption; silver; synchrotron radiation photoelectron spectroscopy;

D O I：

10.1016/S0039-6028(97)01547-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The electronic structure of epitaxial C-60 films grown on Ag(110) has been thoroughly investigated by means of high-resolution photoemission and X-ray absorption spectroscopy. The epilayer is obtained by annealing high-coverage fullerene films at selected temperatures (400 and 500 degrees C). The adlayer-substrate interaction is proven to be dominated by ionic character with a sizeable charge transfer as indicated by the partial filling up of the pi*-derived LUMO orbitals. An apparent discrepancy in the estimate of the LUMO occupancy is found when comparing our results with scanning tunnelling spectroscopy (STS) measurements. This effect is interpreted in terms of the differing surface sensitivity of the two spectroscopies (STS versus XPS).

引用

页码：1066 / 1070

页数：5

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