Substrate-mediated anisotropy of transport properties in YBa2Cu3O7-delta thin films

被引：25

作者：

Haage, T ^{[1
]}

Li, JQ ^{[1
]}

Leibold, B ^{[1
]}

Cardona, M ^{[1
]}

Zegenhagen, J ^{[1
]}

Habermeier, HU ^{[1
]}

Forkl, A ^{[1
]}

Jooss, C ^{[1
]}

Warthmann, R ^{[1
]}

Kronmuller, H ^{[1
]}

机构：

[1] MAX PLANCK INST MET RES,D-70569 STUTTGART,GERMANY

来源：

SOLID STATE COMMUNICATIONS | 1996年 / 99卷 / 08期

关键词：

high-T-c; superconductors; thin films; scanning and transmission electron microscopy; scanning tunneling microscopy; flux pinning and creep;

D O I：

10.1016/0038-1098(96)00287-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have generated an almost periodic step structure of c-axis-oriented YBa2Cu3O7-delta films grown on 10 degrees miscut SrTiO3(001) substrates. Combined scanning tunneling microscopy and cross-sectional transmission electron microscopy studies reveal that this growth morphology is linked to an anisotropic defect microstructure. We present evidence that translational boundaries contribute to strong flux pinning in our films. The resistivity and critical current density in the miscut-grown YBa2Cu3O7-delta films have been found to be anisotropic. Copyright (C) 1996 Published by Elsevier Science Ltd

引用

页码：553 / 557

页数：5

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