Metal ion and oxygen vacancies in bulk and thin film La1-xSrxCoO3

被引：24

作者：

Friessnegg, T

Madhukar, S

Nielsen, B

Moodenbaugh, AR

Aggarwal, S

Keeble, DJ

Poindexter, EH

Mascher, P

Ramesh, R

机构：

[1] Brookhaven Natl Lab, Div Mat Sci, Upton, NY 11973 USA

[2] Univ Maryland, Dept Mat Sci & Nucl Engn, College Pk, MD 20742 USA

[3] Univ Dundee, Carnegie Lab Phys, Dundee DD1 4HN, Scotland

[4] USA, Res Lab, Adelphi, MD USA

[5] McMaster Univ, Ctr Electrophoton Mat & Devices, Dept Engn Phys, Hamilton, ON L8S 4L7, Canada

[6] Univ Maryland, Dept Mat Sci & Nucl Engn, College Pk, MD 20742 USA

来源：

PHYSICAL REVIEW B | 1999年 / 59卷 / 20期

关键词：

D O I：

10.1103/PhysRevB.59.13365

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Positron-lifetime and depth-resolved Doppler-broadening spectroscopy were used to investigate vacancies formed in bulk and laser ablated thin film La1-xSrxCoO3. In bulk samples, metal ion vacancies, which are most likely situated in the La sublattice, show a lifetime of 219 ps and a Doppler-broadening S parameter 1.06 times higher than the bulk. The metal-ion vacancy concentration increases with increasing Sr content. For x greater than or equal to 0.3, oxygen vacancies are detected, yielding a positron lifetime of 149 ps, only 10 ps longer than the bulk lifetime; the S parameter is 4% higher than for the bulk. For a given Sr concentration the films show a higher defect density than the bulk samples. The introduction of oxygen vacancy related defects is observed for increasing Sr doping concentration for both film and bulk samples. In films these defects probably consist of larger clusters and/or form complexes with metal ion vacancies. [S0163-1829(99)03519-5].

引用

页码：13365 / 13369

页数：5