An investigation into the use of electron back scattered diffraction to measure recrystallised fraction

被引：58

作者：

Black, MP ^{[1
]}

Higginson, RL ^{[1
]}

机构：

[1] Univ Sheffield, Dept Mat Engn, IMMPETUS, Sheffield S1 3JD, S Yorkshire, England

来源：

SCRIPTA MATERIALIA | 1999年 / 41卷 / 02期

关键词：

microstructure; recrystallisation; electron back scattered diffraction (EBSD);

D O I：

10.1016/S1359-6462(99)00051-2

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Partially recrystallized 316L stainless steel specimens were examined by using the Electron-Backscattered Diffraction (EBSD) technique. EBSD observations we made using a scanning electron microscope fitted with a standard tungsten filament and equipped with image grabbing and enhancement software package. Through careful mapping of the partially recrystallized structures, the quality of the diffraction pattern, or Band Contrast, enable to distinguish the recrystallized and unrecrystallized regions. The results show good agreement with optical measurements for the fraction recrystallized, although the recrystallizing gram size is smaller when measured with EBSD.

引用

页码：125 / 129

页数：5