RuxCr1-x/Ta underlayer for Co-alloy perpendicular magnetic recording

The effects of the RuxCr1-x/Ta underlayer on the microstructural and magnetic properties of CoCrPtB perpendicular films were investigated. The hcp RuxCr1-x (0002) texture was observed to grow perpendicular to the film plane with narrow rocking curves of 2degrees-3degrees. High-resolution transmission electron microscopy indicated epitaxial growth of the CoCrPtB on top of the RuxCr1-x/Ta underlayer. In-plane x-ray diffraction scans indicate that as the Cr atomic composition increases in the RuxCr1-x underlayer, the a-lattice parameter was found to contract more closely matching the CoCrPtB a-lattice parameter [measured with (11 (2) over bar0)]. In addition, the rocking curves for the CoCrPtB (0002)-texture induced by the (0002) textured RuxCr1-x buffer showed narrowing peaks (4.5degrees-3.5degrees) as the Cr concentration increased from 0% to 40%. (C) 2002 American Institute of Physics.