Mapping of methane spatial distribution around biogas plant with an open-path tunable diode absorption spectroscopy scanning system

被引:3
作者
Zhang, Shirui [1 ]
Wang, Jihua [1 ,2 ]
Dong, Daming [2 ]
Zheng, Wengang [2 ]
Zhao, Xiande [2 ]
机构
[1] Shanghai Jiao Tong Univ, Sch Mech Engn, Shanghai 200240, Peoples R China
[2] Beijing Acad Agr & Forestry Sci, Natl Engn Res Ctr Informat Technol Agr, Beijing 100097, Peoples R China
基金
国家高技术研究发展计划(863计划); 中国国家自然科学基金;
关键词
methane detection; open path tunable diode laser absorption spectroscopy; maximum likelihood with expectation minimization; smooth basis function minimization; two-dimensional gas mapping; CHEMICAL CONCENTRATIONS; COMPUTED-TOMOGRAPHY; FTIR SPECTROSCOPY; EMISSIONS; GASES;
D O I
10.1117/1.OE.52.2.026203
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An open-path tunable diode laser absorption spectroscopy (OP-TDLAS) detector was applied to detect the methane emission from a biogas plant in a dairy farm. Two OP-TDLAS scanning systems were built according to maximum likelihood with expectation minimization (MLEM) and smooth basis function minimization (SBFM) algorithms to reconstruct the two-dimensional (2-D) distribution maps. Six reconstruction maps with the resolution of 30 x 80 were obtained by the MLEM algorithm with "grid translation method" and three reconstruction maps were obtained by the SBFM algorithm with 2-D Gaussian model. The maximum mixing ratio in the first result was between 0.85 and 1.30 ppm, while it was between 1.14 and 1.30 ppm in the second result. The average mixing ratio in the first result was between 0.54 and 0.49 ppm, and between 0.56 and 0.65 ppm in the second result. The reconstruction results validated that the two algorithms could effectively reflect the methane mixing ratio distribution within the target area. However, with the more simple optical rays and less equipment requirements, the OP-TDLAS scanning system based on SBFM algorithm provides a useful monitoring tool of methane emissions in agricultural production. (C) 2013 Society of Photo-Optical Instrumentation Engineers (SPIE) [DOI: 10.1117/1.OE.52.2.026203]
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页数:8
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