A novel method for measuring the strength of microbeams

被引:6
作者
Elata, D [1 ]
Hirshberg, A [1 ]
机构
[1] Technion Israel Inst Technol, Fac Mech Engn, IL-32000 Haifa, Israel
关键词
mechanical test device; strength of microstructures;
D O I
10.1109/JMEMS.2006.872237
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel method and test structure for measuring the strength of brittle microbeams is presented. The method does not require any measurement of forces or displacements. The test structure includes a microbeam that is wrapped over a curved side-wall by application of an unmeasured force. With the progression of wrapping, increasing tensile stresses are induced in the microbeam. When sufficiently high stresses are induced, the beam breaks. The failure stress is deduced by measuring the length of the remaining ligament of the broken beam. The method is demonstrated by measuring the strength of microbeams; in bulk-micromachined test structures.
引用
收藏
页码:396 / 405
页数:10
相关论文
共 19 条
[1]   Strength reliability of statically indeterminate heterogeneous beams [J].
Altus, E ;
Givli, S .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2003, 40 (09) :2069-2083
[2]  
[Anonymous], 1996, NEW WEIBULL HDB
[3]  
BERGER JD, 2001, OPT FIB COMM C EXH
[4]   Controlling and testing the fracture strength of silicon on the mesoscale [J].
Chen, KS ;
Ayon, A ;
Spearing, SM .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2000, 83 (06) :1476-1484
[5]   Effect of process parameters on the surface morphology and mechanical performance of silicon structures after deep reactive ion etching (DRIE) [J].
Chen, KS ;
Ayón, AA ;
Zhang, X ;
Spearing, SM .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2002, 11 (03) :264-275
[6]   Measured mechanical properties of LIGA Ni structures [J].
Cho, HS ;
Hemker, KJ ;
Lian, K ;
Goettert, J ;
Dirras, G .
SENSORS AND ACTUATORS A-PHYSICAL, 2003, 103 (1-2) :59-63
[7]  
DEMASI B, 2004, 17 IEEE INT C MICR E
[8]   Design of large deflection electrostatic actuators [J].
Grade, JD ;
Jerman, H ;
Kenny, TW .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2003, 12 (03) :335-343
[9]   The DMD™ projection display chip:: A MEMS-based technology [J].
Hornbeck, LJ .
MRS BULLETIN, 2001, 26 (04) :325-327
[10]  
JONES PT, 1999, SPIE C MEMS REL CRIT