Absolute wavelengths in Te-130(2): New reference lines for laser spectroscopy coinciding with emissions of the Ar+ laser

被引：19

作者：

Cancio, P

Bermejo, D

机构：

[1] Inst. de Estructura de la Materia, Consejo Sup. de Invest. Cientificas, Serrano 123-28006, Madrid

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 1997年 / 14卷 / 06期

关键词：

D O I：

10.1364/JOSAB.14.001305

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have observed the hyperfine spectrum of Te-130(2) that coincides with the visible emissions of an Ar+ laser by using Doppler-free polarization spectroscopy. The vacuum wavelengths of the 16 transitions observed have been measured by a high-precision wavemeter with an uncertainty ranging from 6 parts in 10(9) in the best case to 1.4 parts in 10(8) in the worst case. These measurements provide a set of precise molecular references to frequency locking of visible Lines of Ar+ lasers used in high-precision laser spectrometers. (C) 1997 Optical Society of America.

引用

页码：1305 / 1311

页数：7

共 24 条

[11] STABILITY, REPRODUCIBILITY, AND ABSOLUTE WAVELENGTH OF A 633-NM HE-NE-LASER STABILIZED TO AN IODINE HYPERFINE COMPONENT [J].

HANES, GR ;

BAIRD, KM ;

DEREMIGIS, J .

APPLIED OPTICS, 1973, 12 (07) :1600-1605

[12] VAPOR PRESSURE OF LIQUID TELLURIUM [J].

MACHOL, RE ;

WESTRUM, EF .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1958, 80 (12) :2950-2952

[13] INTERFEROMETRIC FREQUENCY-MEASUREMENT OF TE-130(2) REFERENCE TRANSITIONS AT 486 NM [J].

MCINTYRE, DH ;

FAIRBANK, WM ;

LEE, SA ;

HANSCH, TW ;

RIIS, E .

PHYSICAL REVIEW A, 1990, 41 (09) :4632-4635

[14] ABSOLUTE CALIBRATION OF THE TE-130(2) REFERENCE LINE FOR POSITRONIUM 1 3S1-2 3S1 SPECTROSCOPY [J].

MCINTYRE, DH ;

HANSCH, TW .

PHYSICAL REVIEW A, 1986, 34 (05) :4504-4507

[15] INTERFEROMETRIC FREQUENCY-MEASUREMENT OF A TE-130(2) REFERENCE LINE FOR MUONIUM 1S-2S SPECTROSCOPY [J].

MCINTYRE, DH ;

HANSCH, TW .

PHYSICAL REVIEW A, 1987, 36 (08) :4115-4118

[16] REALIZATION OF A LAMBDAMETER [J].

MILAN, C ;

PULLICINO, M ;

ROUSSEL, G ;

MORETBAILLY, J .

JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1984, 15 (01) :31-41

[17] ACCURATE LASER WAVELENGTH MEASUREMENT WITH A PRECISION 2-BEAM SCANNING MICHELSON INTERFEROMETER [J].

MONCHALIN, JP ;

KELLY, MJ ;

THOMAS, JE ;

KURNIT, NA ;

SZOKE, A ;

ZERNIKE, F ;

LEE, PH ;

JAVAN, A .

APPLIED OPTICS, 1981, 20 (05) :736-757

[18]

OBARSKI GE, 1990, NATL I STAND TECHNOL, V1336, P7

[19]

*OPTH INSTR INC, ID SOURC TELL CELL I

[20]

*OPTH INSTR INC, ID SOURC IOD CELL IS

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