Evidence for photoelectron backscattering by interstitial charge densities

被引：23

作者：

Wende, H

Srivastava, P

Chauvistre, R

May, F

Baberschke, K

Arvanitis, D

Rehr, JJ

机构：

[1] FREE UNIV BERLIN,INST EXPT PHYS,D-14195 BERLIN,GERMANY

[2] UNIV UPPSALA,DEPT PHYS,S-75121 UPPSALA,SWEDEN

[3] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195

[4] UNIV RAJASTHAN,DEPT PHYS,JAIPUR 302004,RAJASTHAN,INDIA

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1997年 / 9卷 / 31期

关键词：

D O I：

10.1088/0953-8984/9/31/002

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The presence of oscillatory structures in the atomic x-ray absorption background is reported for the first time for surface-EXAFS of c(2 x 2)N/Cu(100) and (2 x 3)N/Cu(110). Systematic analysis of this feature (AXAF'S) and comparison to theory yields new information on the electronic structure of the adsorbate-substrate surface bond. Also, angle and temperature dependent analysis of the AXAFS peak provides qualitative information about interstitial charge density distribution.

引用

页码：L427 / L433

页数：7

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