Broadening of submonolayer CdSe sheets in CdSe ZnSe superlattices studied by x-ray diffraction

被引:51
作者
Kyutt, RN
Toropov, AA
Sorokin, SV
Shubina, TV
Ivanov, SV
Karlsteen, M
Willander, M
机构
[1] RAS, Ioffe Inst, St Petersburg 194021, Russia
[2] Chalmers Univ Technol, Dept Microelect & Nanosci, S-41296 Gothenburg, Sweden
[3] Gothenburg Univ, S-41296 Gothenburg, Sweden
关键词
D O I
10.1063/1.124379
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present x-ray diffraction studies of a CdSe distribution profile along the growth direction in CdSe/ZnSe submonolayer superlattices (SLs) grown by molecular beam epitaxy. The performed theoretical simulations show that the shape of both (004)- and (002)-reflection rocking curves is very sensitive to the vertical CdSe distribution around the intended deposition yplanes. In particular, broadening of the CdSe submonolayer insertions results in a decrease in SL (+/-1) and (+/-2) satellite intensities. Comparison of the simulations and experimental data allows us to conclude that CdSe sheets in the as-grown SL samples are asymmetrically broaden up to 5 monolayers. (C) 1999 American Institute of Physics. [S0003-6951(99)00629-4].
引用
收藏
页码:373 / 375
页数:3
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