Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

被引：38

作者：

Hecht, M. H. ^{[1
]}

Marshall, J. ^{[2
]}

Pike, W. T. ^{[3
]}

Staufer, U. ^{[4
]}

Blaney, D. ^{[1
]}

Braendlin, D. ^{[5
]}

Gautsch, S. ^{[4
]}

Goetz, W. ^{[6
]}

Hidber, H. -R. ^{[7
]}

Keller, H. U. ^{[6
]}

Markiewicz, W. J. ^{[6
]}

Mazer, A. ^{[1
]}

Meloy, T. P. ^{[8
]}

Morookian, J. M. ^{[1
]}

Mogensen, C. ^{[1
]}

Parrat, D. ^{[4
]}

Smith, P. ^{[9
]}

Sykulska, H.

Tanner, R. J. ^{[9
]}

Reynolds, R. O. ^{[9
]}

Tonin, A. ^{[7
]}

Vijendran, S. ^{[3
]}

Weilert, M. ^{[1
]}

Woida, P. M. ^{[9
]}

机构：

[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

[2] SETI Inst, Mountain View, CA 94043 USA

[3] Univ London Imperial Coll Sci Technol & Med, Dept Elect & Elect Engn, London SW7 2DD, England

[4] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland

[5] Nanosurf AG, CH-4410 Liestal, Switzerland

[6] Max Planck Inst Solar Syst Res, D-37191 Katlenburg Lindau, Germany

[7] Univ Basel, Dept Phys, CH-4003 Basel, Switzerland

[8] W Virginia Univ, Coll Engn & Mineral Resources, Morgantown, WV 26501 USA

[9] Univ Arizona, Lunar & Planetary Lab, Tucson, AZ 85721 USA

来源：

JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS | 2008年 / 113卷

基金：

英国科学技术设施理事会;

关键词：

D O I：

10.1029/2008JE003077

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light-emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet-induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.

引用

页数：28

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