The AETG system: An approach to testing based on combinatorial design

被引:572
作者
Cohen, DM
Dalal, SR
Fredman, ML
Patton, GC
机构
[1] BELLCORE,MORRISTOWN,NJ 07960
[2] RUTGERS STATE UNIV,DEPT COMP SCI,NEW BRUNSWICK,NJ 08903
关键词
testing; combinatorial designs; experimental designs; orthogonal arrays;
D O I
10.1109/32.605761
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
This paper describes a new approach to testing that uses combinatorial designs to generate tests that cover the pairwise, triple, or n-way combinations of a system's test parameters. These are the parameters that determine the system's test scenarios. Examples are system configuration parameters, user inputs and other external events. We implemented this new method in the AETG system. The AETG system uses new combinatorial algorithms to generate test sets that cover ail valid n-way parameter combinations. The size of an AETG test set grows logarithmically in the number of test parameters. This allows testers to define test models with dozens of parameters. The AETG system is used in a variety of applications for unit, system, and interoperability testing. It has generated both high-level test plans and detailed test cases. In several applications, it greatly reduced the cost of test plan development.
引用
收藏
页码:437 / 444
页数:8
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