Uncertainties in interferometric measurements of radius of curvature

被引:50
作者
Schmitz, TL [1 ]
Davies, AD [1 ]
Evans, CJ [1 ]
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
来源
OPTICAL MANUFACTURING AND TESTING IV | 2001年 / 4451卷
关键词
radius of curvature; interferometry; uncertainty analysis; diffraction;
D O I
10.1117/12.453641
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The radius of curvature of spherical surfaces may be determined using the well-known radius, or optical, bench. In this method, a figure measuring interferometer is employed to identify the null positions at the center of curvature (confocal) and surface (cat's eye) of the test optic. A linear slide provides motion between these positions and one or more displacement transducers is used to record the displacement between the cat's eye and confocal positions and, hence, the radius of curvature. Measurements of a polished Zerodur sphere have been completed on the X-ray Optics Calibration Interferometer (XCALIBIR) using both Twyman-Green and Fizeau configurations. Mechanical measurements of the spherical artifact have also been completed using a coordinate measuring machine (CMM). Recorded disagreement between the individual transmission sphere measurements and CMM measurements under well-controlled environmental conditions is larger than the limits predicted from a traditional uncertainty analysis based on a geometric measurement model. Additional uncertainty sources for the geometric model, as well as a physical optics model of the propagation of light, are therefore suggested. The expanded uncertainty analysis is described.
引用
收藏
页码:432 / 447
页数:16
相关论文
共 16 条
[1]   RECENT ADVANCES IN DISPLACEMENT MEASURING INTERFEROMETRY [J].
BOBROFF, N .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1993, 4 (09) :907-926
[2]   RESIDUAL ERRORS IN LASER INTERFEROMETRY FROM AIR TURBULENCE AND NONLINEARITY [J].
BOBROFF, N .
APPLIED OPTICS, 1987, 26 (13) :2676-2682
[4]  
CHAPRA S, 1985, NUMERICAL METHODS EN, P291
[5]  
ESTLER WT, 1985, APPL OPTICS, V24, P808, DOI 10.1364/AO.24.000808
[6]  
Evans C J., 1996, CIRP Ann, V45, P617, DOI [10.1016/S0007-8506(07)60515-0, DOI 10.1016/S0007-8506(07)60515-0]
[7]  
HOBBS PCD, 2000, BUILDING ELECTROOPTI, P12
[8]  
*INT ORG STAND ISO, 1995, GUID EXPR UNC MEAS
[9]  
MALACARA D, 1992, OPTICAL SHOP TESTING, P728
[10]   MEASUREMENT OF LONG RADIUS OF CURVATURE [J].
MURTY, MVRK ;
SHUKLA, RP .
OPTICAL ENGINEERING, 1983, 22 (02) :231-235