GMR in corrugated Co/Cu multilayers

被引：3

作者：

Maeda, A ^{[1
]}

Tanuma, T ^{[1
]}

Kume, M ^{[1
]}

Shimizu, R ^{[1
]}

Doi, A ^{[1
]}

机构：

[1] SANYO ELECT CO LTD,CTR MICROELECT RES,ANPAICHI,GIFU 50301,JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1997年 / 33卷 / 05期

关键词：

D O I：

10.1109/20.619489

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new corrugated material comprising anti ferromagnetically coupled Co/Cu multilayers was prepared using V-grooved Si substrates. Scanning electron microscopy and x-ray diffraction observations indicate that the corrugated multilayers were successfully grown with the formation of smooth and clear interfaces, Magnetoresistance change with the sense current normal to the grooves was larger than that with the current parallel to the grooves. The MR enhancement due to the difference in measurement geometry increased as the width of the grooves decreased.

引用

页码：3535 / 3537

页数：3

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