High pressure X-ray diffraction study of beta-Si3N4

被引：42

作者：

Li, YM

Kruger, MB

Nguyen, JH

Caldwell, WA

Jeanloz, R

机构：

[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720

[2] UNIV CALIF BERKELEY,DEPT GEOL & GEOPHYS,BERKELEY,CA 94720

来源：

SOLID STATE COMMUNICATIONS | 1997年 / 103卷 / 02期

关键词：

X-ray scattering; crystal binding and equation of state; synchrotron radiation;

D O I：

10.1016/S0038-1098(97)00137-3

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

X-ray diffraction data collected at quasi-hydrostatic pressures of 5-34 GPa yield an average zero-pressure bulk modulus and pressure derivative of K-0 = 270(+/-5) GPa and K-0' = 4.0(+/-1.8) for beta-Si3N4 at room temperature. Similar linear incompressibilities along the a and c crystallographic directions document that compression is nearly isotropic. (C) 1997 Elsevier Science Ltd.

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收藏

页码：107 / 112

页数：6

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