Effects of in-plane high angle grain boundaries in YBa2Cu3O7 thin films epitaxially grown on (100) MgO on their physical properties

被引：13

作者：

Castel, X ^{[1
]}

GuillouxViry, M ^{[1
]}

Padiou, J ^{[1
]}

Perrin, A ^{[1
]}

Sergent, PM ^{[1
]}

LePavenThivet, C ^{[1
]}

机构：

[1] UNIV RENNES 1, CHIM SOLIDE & INORGAN MOL LAB, CNRS, URA 1495, F-35042 RENNES, FRANCE

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 1997年 / 251卷 / 1-2期

关键词：

thin-films; YBaCuO; MgO; microwave properties; growth;

D O I：

10.1016/S0925-8388(96)02773-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In laser ablation epitaxially grown YBa2Cu3O7 (YBCO) films on (100) MgO, two in-plant orientations, called c(perpendicular to 0) and c(perpendicular to 45) compete, leading to an array of High Angle Grain Boundaries (HAGB). The ratio of these two in-plane orientations has been measured by XRD phi-scans. The HAGB density correlates strongly and similarly with both the surface resistance and the area under the chi'' AC susceptibility curve, giving also a strong evidence for a relation between these two data. In contrast no actual correlation has been found with any other structural or physical characteristic. (C) Elsevier Science S.A.

引用

页码：74 / 77

页数：4

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