A formula for the image intensity of phase objects in Zernike mode

被引:21
作者
Beleggia, Marco [1 ]
机构
[1] Univ Leeds, Inst Mat Res, Leeds LS2 9JT, W Yorkshire, England
关键词
Zernike phase plates; phase contrast; phase objects; electron microscopy;
D O I
10.1016/j.ultramic.2008.03.003
中图分类号
TH742 [显微镜];
学科分类号
摘要
I present an analytical expression for the image intensity of a phase object visualized in Zernike phase contrast mode. The formula is valid for periodic and non-periodic weak and strong objects, and accounts for the effects of finite illumination. The expression provided is intended as a generalization of the standard reference formula given in the Born and Wolf [Principles of Optics, sixth ed., Pergamon Press, New York, 1980, p. 427] textbook as well as of the formalism employed to evaluate imaging doses in Zernike mode [M. Malac, M. Beleggia, R. Egerton, Y. Zhu, Ultramicroscopy 108 (2008) 126]. 1 illustrate the usefulness of the improved expression by means of three examples: a sinusoidal phase grating, a Gaussian object, and a phase step. The optimal Zernike phase angle yielding maximum image contrast is found to be object-dependent and not necessarily equal to pi/2. Phase plate optimization criteria are derived and presented for two of the examples considered. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:953 / 958
页数:6
相关论文
共 10 条
[1]  
BORN M, 1980, PRINCIPLES OPTICS, P427
[2]  
CHEN KH, 2007, MICRON
[3]   Transmission electron microscopy with Zernike phase plate [J].
Danev, R ;
Nagayama, K .
ULTRAMICROSCOPY, 2001, 88 (04) :243-252
[4]   The fabrication and application of Zernike electrostatic phase plate [J].
Huang, Sen-Hui ;
Wang, Wan-Jhih ;
Chang, Chia-Seng ;
Hwu, Yeu-Kuang ;
Tseng, Fan-Gang ;
Kai, Ji-Jung ;
Chen, Fu-Rong .
JOURNAL OF ELECTRON MICROSCOPY, 2006, 55 (06) :273-280
[5]   Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates [J].
Malac, Marek ;
Beleggia, Marco ;
Egerton, Ray ;
Zhu, Yimei .
ULTRAMICROSCOPY, 2008, 108 (02) :126-140
[6]   Fabrication of a Boersch phase plate for phase contrast imaging in a transmission electron microscope [J].
Schultheiss, K ;
Pérez-Willard, F ;
Barton, B ;
Gerthsen, D ;
Schröder, RR .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (03)
[7]  
VOELKL E, 1996, INTRO ELECT HOLOGRAP
[8]   Phase contrast, a new method for the microsopic observation of transparent objects [J].
Zernike, F .
PHYSICA, 1942, 9 :686-698
[9]   HOW I DISCOVERED PHASE CONTRAST [J].
ZERNIKE, F .
SCIENCE, 1955, 121 (3141) :345-349
[10]   Phase contrast, a new method for the microscopic observation of transparent objects Part II [J].
Zernike, F .
PHYSICA, 1942, 9 :974-986