Dynamic coercivity measurements in thin film recording media using a contact write/read tester

被引:64
作者
Moser, A
Weller, D
Best, ME
Doerner, MF
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] IBM Corp, Storage Syst Div, San Jose, CA 95193 USA
关键词
D O I
10.1063/1.370077
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thermally activated magnetization reversal processes become manifest in the dependence of the remanent coercivity on the time during which a magnetic field is applied opposite to the initial magnetization direction. They have important consequences for the long term stability and short time writeability of future high density recording media. In this paper, we report on a new experiment using a contact write/read tester to study the time dependence of the remanent coercivity over more than 10 orders of magnitude (from 6 ns to >60 s). Remanence coercivity and signal decay measurements of a CoPtCr recording medium with 5.5 nm thickness are presented. (C) 1999 American Institute of Physics. [S0021-8979(99)62908-5].
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页码:5018 / 5020
页数:3
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